EL Defect Tester is used to testing the solar cell crack,breakage, black spot,mixed wafers,process defect,cold solder joint phenomenon.
Used in testing the solar cell crack,breakage, black spot,mixed wafers,process defect,cold solder joint phenomenon.
Item | OEL-S2400 |
Capture Mode | Single Camera |
Run Mode | Offline |
Monitor Point | After Laminating |
Sample Stage | Super-white Tempered Glass |
Sample Size | ≤2200mm*1200mm |
Operation Height | 950mm |
Exposure Time | 1 ~ 60s |
Current/Voltage | 10A/60V |
Software | 1.Interface for barcode scanning, naming files with barcode names; |
Detection Ability | crack, black spot, mixed wafers, process defect, cold solder joint. |
Configuration | Testing host, computer, software |
Ooitech “Turnkey Solution” Includes: Factory Construction, Facility Layout, Raw Materials BOM guidance, Production Procedure assistance, Solar Power Station installation technical support Etc.
Supply 10MW-500MW Turnkey PV Production Line
Update the traditional PV line to the newest MBB solar panel production line.
Solar Cell Tabber Stringer Machine
Automatic Solder Bussing Machine
High-Speed Automatic Layup Station
Building 1, Zixin Industrial Park, Yangguang Ave,Jiangxia Economic Development Zone, Wuhan of China